SPIE conference
VISE rocks SPIE Medical Imaging Conference racking up five student awards
Mar. 7, 2017—Twenty-five students from five laboratories affiliated with the Vanderbilt Institute in Surgery and Engineering (VISE) attended the SPIE Medical Imaging 2017 Conference in mid-February. Five Vanderbilt students across Computer Science, Electrical Engineering, and Biomedical Engineering were selected for scientific awards out of almost 450 papers presented this year. The week-long conference showcases cutting edge-research, world-class...