VINSE Professional Development

VINSE Atomic Force Microscopy (AFM) Short Course is scheduled for June 12-13. This hands-on course is designed to enhance participants’ understanding of AFM theory while providing practical insights and operational tips on a variety of AFM techniques. Attendance is open to everyone and is not limited to Vanderbilt personnel or VINSE… Read More

Registration is now open for the VINSE Electron Microscopy short course, taking place June 9-10. This course offers the opportunity to advance knowledge and skill with characterizing material and biological specimens at the nanoscale. Participation is open to all, not just Vanderbilt personnel or VINSE users. However, space is limited,… Read More

Electron microscopy is a critical component for the characterization of material and biological specimens at the nanoscale. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) both use electron beams to reveal structure, but in very different ways. Although these instruments have been made very accessible with the help… Read More

AFM is an advanced multi-parametric imaging technique. It delivers very high-resolution 3D images of the topography of the sample. It also enables the characterization of the nano-mechanical, nano-electrical, and nano-magnetic properties of the surface. Users will learn about the theory of AFM as well as practical applications, operational tips… Read More

Microfluidics devices are critical for understanding and controlling fluid flow on the micrometer scale. Applications include portable sensors for point-of-care analysis, particle and cell sorting, nanoparticle synthesis, and organ-on-chip systems. This short course will introduce the techniques behind the fabrication and testing of microfluidic devices through a blend of… Read More

Microelectronic devices are found in an ever-growing number of everyday items such as phones, cars, clothing, and medical products, and ongoing development efforts are aimed to reduce size, increase performance, improve energy efficiency, and integrate into new application areas. The goal of the course is to provide understanding of… Read More

AFM is an advanced multi-parametric imaging technique. It delivers very high-resolution 3D images of the topography of the sample. It also enables the characterization of the nano-mechanical, nano-electrical, and nano-magnetic properties of the surface. Users will learn about the theory of AFM as well as practical applications, operational tips for… Read More

Microfluidic devices can enable “labs on chips” that consume less reagents and have faster analysis times than similar experiments performed in a traditional lab environment. Applications of microfluidic devices include portable sensors for point-of-care analysis, molecular and cell biology studies, and high-throughput, multiplexed assays. This short course will introduce… Read More

Electron microscopy is a critical component for the characterization of material and biological specimens at the nanoscale. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) both use electron beams to reveal structure, but in very different ways. Although these instruments have been made very accessible with the… Read More

VINSE will offer the Atomic Force Microscopy, Electron Microscopy, and Microfluidic Device Fabrication short courses in the spring 2022 semester. Courses will be capped at 16, so don’t wait too long to register.  Details and pricing can be found below! Electron Microscopy Short Course June 12-13 Electron microscopy… Read More