Ronald Schrimpf

Sajal Islam has been appointed to the Graduate Student Council (GSC) to represent Interdisciplinary Materials Science. The GSC exists to enhance the overall educational experience at Vanderbilt University by promoting the general welfare and concerns of the Graduate School student body. This is achieved through the creation of… Read More

DISSERTATION DEFENSE Kan Li, Interdisciplinary Materials Science *under the direction of Dr. Ronald Schrimpf “Laser-induced single event effects, total-ionizing-dose effects, and low-frequency noise in advanced FinFETs” Tuesday, May 24, 2022 | 12:00 | Zoom In this dissertation, radiation effects and low-frequency noise are studied in advanced FinFETs. Read More

Ronald Schrimpf has received the 2021 IEEE Nuclear and Plasma Sciences Society Merit Award for contributions to the understanding of radiation effects in semiconductor devices and integrated circuits. The Merit Award is the highest technical award presented by the IEEE NPSS and the selection criteria include the importance of individual technical contributions as well as… Read More

“3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs” published in IEEE Transactions on Electron Devices has been selected as a VINSE spotlight publication. About the author: Mahmud Reaz earned his Ph.D. in Interdisciplinary Materials Science in July 2021 under the supervision of… Read More

An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron… Read More