Mike Alles
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Collaboration between Vanderbilt and startup Femtometrix leads to exclusive deal
An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron… Read MoreJun. 27, 2013