June 12-13, 2025
Atomic Force Microscopy
AFM is an advanced multi-parametric 3D topography imaging technique. It also enables the characterization of the nano-mechanical, nano-electrical, and nano-magnetic properties of the surface. Users will learn about the theory of AFM as well as practical applications and operational tips for many of the various AFM techniques including imaging in liquid. Various case studies will be explained involving those of considerable current interest such as semiconductors, 2D materials, and biomaterials. Sample preparation techniques and choosing appropriate AFM probes will be demonstrated. The course will also demonstrate the nanomanipulation and nanolithography capabilities of the AFM, including “writing” techniques in either graphical point-and-click mode, or in a recipe-driven mode in air and liquid.
CAP: 10 | REGISTER HERE
$50 Vanderbilt Users; $50 External Academic and Non-Profit Users; $150 Industry and For-Profit Users