Overview
The overarching theme of our research is to study the basic physical mechanisms for SEEs to enable improvements in test methods and models for predicting the performance of circuits when exposed to complex radiation environments.
Awards
-IEEE Fellow
-IEEE/NPSS Early Achievement Award
-Outstanding Young Alumni Award from Clemson University
Selected Publications
Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager. Hu MD, McCurdy MW, Sierawski BD, Schrimpf RD, Reed RA, Alles ML, IEEE Transactions on Nuclear Science, 1, 759-769, (2024) View Abstract
Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes. Sengupta A, Ball DR, Witulski AF, Zhang EX, Schrimpf RD, Galloway KF, Reed RA, Alles ML, McCurdy MW, Sternberg AL, Johnson RA, Howell ME, Osheroff JM, Hutson JM, IEEE Transactions on Nuclear Science, 70, 394-400, (2023) View Abstract
Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes. Cadena RM, Ball DR, Zhang EX, Islam S, Senarath A, McCurdy MW, Farzana E, Speck JS, Karom N, O’Hara A, Tuttle BR, Pantelides ST, Witulski AF, Galloway KF, Alles ML, Reed RA, Fleetwood DM, Schrimpf RD, IEEE Transactions on Nuclear Science, 70, 363-369, (2023) View Abstract
Probing the Single-Event Sensitivity of a COTS 3D-Integrated Imager With Alpha Particle Irradiation. Hu MD, Padgett, F, McCurdy MW, Sierawski BD, Schrimpf RD, Reed RA, Alles, ML, IEEE Transactions on Nuclear Science, 70, 410-417, (2023) View Abstract
Radiation-induced transient response mechanisms in photonic waveguides. Ryder LD, Schrimpf RD, Reed RA, Weiss SM, IEEE Transactions of Nuclear Science, 69, 546-557, (2022) View Abstract
Education
Ph.D., Clemson UniversityM.S., Clemson University
B.S., East Tennessee State University