Overview
Michael L. Alles is the Associate
Director of the Institute for Space and Defense Electronics, which focuses on
issues associated with using electronic devices in harsh environments. His
research programs include theoretical and experimental study of radiation-response
implication of materials and structures used in current and emerging advanced
nano-scaled devices used for processing and memory applications, nano-scaled
electro-mechanical applications, and new integration schemes such as used in
2.5/3D electronics integration.
Selected Publications
Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager. Hu MD, McCurdy MW, Sierawski BD, Schrimpf RD, Reed RA, Alles ML, IEEE Transactions on Nuclear Science, 1, 759-769, (2024) View Abstract
On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs. D'Amico JV, Vibbert ST, Cadena RM, Alles ML, Ball DR, Sternberg AL, Zhang EX, Holman WT, Kauppila JS, Massengill LW, IEEE Transactions on Nuclear Science, 71, 500-507, (2024) View Abstract
Analysis of Single-Event Upsets and Transients in 22 nm Fully Depleted Silicon-On-Insulator Logic. D'Amico JV, Vibbert ST, Watkins AC, Fahrenkrug BC, Haeffner TD, Ball DR, Sternberg AL, Alles ML, Kauppila JS, Massengill LW, IEEE Transactions on Nuclear Science, 70, 387-393, (2023) View Abstract
Probing the Single-Event Sensitivity of a COTS 3D-Integrated Imager With Alpha Particle Irradiation. Hu MD, Padgett, F, McCurdy MW, Sierawski BD, Schrimpf RD, Reed RA, Alles, ML, IEEE Transactions on Nuclear Science, 70, 410-417, (2023) View Abstract
Proton radiation effects on optically transduced silicon carbide microdisk resonators. Jia H, Mccandless JP, Chen HL, Liao WJ, Zhang EX, Mccurdy M, Reed RA, Schrimpf RD, Alles ML, Feng PXL, Optical Materials Express, 13, , (2023) View Abstract
Education
Ph.D., Vanderbilt UniversityM.S., Vanderbilt University
B.E., Vanderbilt University