Probe Station

The electrical probe station is used to electrically characterize samples.  A Micromanipulator 450PM Manual Probe Station with four micromanipulator-controlled probes, X/Y/Z/R stage control, and an integrated optical microscope with a camera feed allow for precise positioning of probe tips on samples.   A ring of LEDs on the microscope enables sample illumination at a range of intensities for sample inspection and preliminary light-sensitive electrical testing.  The set-up has a cover to minimize vibrations and stray light.  A Keithley 4200A Semiconductor Characterization System with two SMUs controls electrical inputs and outputs, enabling data collection and visualization of IV and CV curves for two- and four-terminal devices.