Atomic Force Microscope (AFM)

The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. The Icon is also equipped with a heater controller to be used in conjunction with the fluid cell kit. The cell kit allows real-time observations of samples under native conditions while providing sample heating and temperature control when liquids are being studied.

Nanomanipulation and nanolithography capabilities integrate object manipulation and surface modification in air and liquid with nanoscale imaging. Both immediate and programmed commands are available to probe a sample between image scans of the field of view. Proprietary ScanAsyst® automatic image optimization technology enables easier, faster, and more consistent results, regardless of user skill level. The Icon’s uncommon ease of use, ultimate performance, exceptional productivity, and superior versatility make it an ideal choice for practically every AFM application.