![](https://www.vanderbilt.edu/vinse/wp-content/uploads/sites/40/2024/03/nano-optics-2-1024x682.jpg)
Equipment
- Atomic Force Microscope - Bruker Dimension Icon
- Focused Ion Beam - Scanning Electron Microscope - FEI Helios NanoLab G3 CX with Quorum PP3010T Cryo-SEM System
- Scanning Electron Microscope - Zeiss Merlin with Gemini II Column
- Transmission Electron Microscope - FEI Tecnai G2 Osiris S/TEM
- Advanced Imaging PC for Image Stack Processing
User Fees
![placeholder image](http://www.vanderbilt.edu/vinse/wp-content/uploads/sites/40/2024/01/VINSE-Photos-Short-List-59-cropped.jpg)
![placeholder image](http://www.vanderbilt.edu/vinse/wp-content/uploads/sites/40/2024/02/VINSE-Photos-Short-List-68.jpg)
Facility Details
![](https://www.vanderbilt.edu/vinse/wp-content/uploads/sites/40/2024/03/nano-optics-2-1024x682.jpg)
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Millimeter to Angstrom Scale Imaging
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Specimen Prep and Packaging Lab
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All Sample Types
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Cryo Capabilities
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Nanoscale Elemental Analysis
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User Friendly
Founded on bedrock, four imaging bays host our modern electron, ion and scanning probe instrumentation for the characterization of nanomaterials and devices.
Each bay is designed to provide a controlled environment that minimizes disturbances such as ambient noise, floor vibrations and electromagnetic field levels that meet or exceed manufacturer’s specifications for our instruments, providing the best possible imaging resolution.
![placeholder image](http://www.vanderbilt.edu/vinse/wp-content/uploads/sites/40/2024/03/SEM-Photo-2.jpg)
![placeholder image](http://www.vanderbilt.edu/vinse/wp-content/uploads/sites/40/2024/03/SEM-photo.jpg)