VINSE Atomic Force Microscopy (AFM) Short Course is scheduled for June 12-13. This hands-on course is designed to enhance participants’ understanding of AFM theory while providing practical insights and operational tips on a variety of AFM techniques. Attendance is open to everyone and is not limited to Vanderbilt personnel or VINSE users. Please note that space is limited to 10 participants, and early registration is strongly encouraged to secure your spot.
Atomic Force Microscopy
AFM is an advanced multi-parametric 3D topography imaging technique. It also enables the characterization of the nano-mechanical, nano-electrical, and nano-magnetic properties of the surface. Users will learn about the theory of AFM as well as practical applications and operational tips for many of the various AFM techniques including imaging in liquid. Various case studies will be explained involving those of considerable current interest such as semiconductors, 2D materials, and biomaterials. Sample preparation techniques and choosing appropriate AFM probes will be demonstrated. The course will also demonstrate the nanomanipulation and nanolithography capabilities of the AFM, including “writing” techniques in either graphical point-and-click mode, or in a recipe-driven mode in air and liquid. CAP: 10
June 12 – 13, 2025 | Register
$50 Vanderbilt Users; $50 External Academic and Non-Profit Users; $150 Industry and For-Profit Users