Electron microscopy is a critical component for the characterization of material and biological specimens at the nanoscale. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) both use electron beams to reveal structure, but in very different ways. Although these instruments have been made very accessible with the help of software, users must understand the mechanisms behind image formation to properly interpret their images. This two-day short course will blend accessible lectures with hands-on experience operating both the Zeiss Merlin SEM and the Tecnai Osiris advanced analytical TEM/STEM. After completing this course, users will know how best to operate both instruments to get the most information and achieve the best possible images. Specific techniques include secondary electron vs. backscattered electron imaging, bright field/dark field TEM, STEM and analytical SEM and STEM using energy dispersive spectroscopy.
Time – June 10 & 11, 2024
Cost – $75 Vanderbilt Users; $75 External Academic and Non-Profit Users; $200 Industry and For-Profit Users