Drew Tonigan received his Ph.D. from the Interdisciplinary Materials Science Program at Vanderbilt University program, working with Ron Schrimpf and the team at the Institute for Space and Defense Electronics (ISDE). Drew’s research examined one of the most important reliability challenges for advanced electronics: errors produced in digital circuits by energetic particles. In particular, he looked at how the properties of the materials and interfaces in the devices affect collection of the charge generated by the energetic particles. Drew is now an R&D scientist at Sandia National Laboratories in Albuquerque, New Mexico researching radiation effects on microelectronics with recent work focusing on single event effects and fission/fusion reactor experiments.